News

2023-12-01 -- Organization Committee was updated.

• Mr. Shunsuke ASAHINA (JEOL Ltd.) was affiliated.

2023-06-21 -- Biological Metrology and Application (BMA) Workshop was dissolved.

The Biometrics and Applications Meeting (BMA) will be dissolved on 21 June 2023.

We would like to express our sincere gratitude to the planning committee members and all the speakers and participants for their great support and cooperation.

2022-11-11 -- NANOTS2022 was finished.

NANOTS2022 was finished. Thank you for your participation. The number of participants was 216.

The next 43th annual NANO Testing Symposium (NANOTS2023) will be held in Osaka, 7-9 November 2023.

2022-07-01 -- Organization Committee was updated.

• Prof. Kojima Kazunobu (Osaka Univ.) was affiliated.

2021-10-01 -- Organization Committee was updated.

• Mr. Masahiko Tsujita (Sony Semiconductor Manufacturing Corp.) was affiliated.

2021-02-16 -- INANOT related conference: IPFA2021 call for papers

2018-01-12 -- INANOT related conference: IPFA2018 call for papers

2017-06-13 -- INANOT related conference: CIPS 2018 call for papers

We are pleased to announce a call for papers of CIPS 2018 (10th International Conference on Integrated Power Electronics Systems) which is closely related to INANOT (the Institute of NANO Testing).

Please see CIPS 2018 call for papers.

The deadline for the submission of abstracts is June15, 2017. Please kindly consider submitting your work to CIPS 2018.

2016-02-01 -- Biological Metrology and Application (BA) Workshop was founded.

Biological Metrology and Application (BA) Workshop was founded on February 1 2016.

2015-12-18 -- INANOT related conference: ESREF 2016 call for papers

ESREF 2016, the 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis will take place in Halle (Saale), Germany from September 19th to 22nd, 2016.

The conference continues to focus on recent developments and future directions in quality, robustness and reliability research of materials, components, integrated electronic circuits/systems and their nano-, micro-, power-, optoelectronics devices. ESREF provides the leading European forum for developing all aspects of reliability management and failure prevention for present and future electronics. ESREF 2016 will have a specific focus on reliability issues in automotive electronics.

For more details, please see ESREF_2016_CfP.pdf and visit ESREF 2016 web site.

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