ナノテスティング学会

The Institute of Nano Testing

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2015-12-18

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News: INANOT related conference: fileESREF 2016 call for papers

ESREF 2016, the 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis will take place in Halle (Saale), Germany from September 19th to 22nd, 2016.

The conference continues to focus on recent developments and future directions in quality, robustness and reliability research of materials, components, integrated electronic circuits/systems and their nano-, micro-, power-, optoelectronics devices. ESREF provides the leading European forum for developing all aspects of reliability management and failure prevention for present and future electronics. ESREF 2016 will have a specific focus on reliability issues in automotive electronics.

For more details, please see fileESREF_2016_CfP.pdf and visit ESREF 2016 web site.