We are pleased to announce a call for papers of CIPS 2018 (10th International Conference on Integrated Power Electronics Systems) which is closely related to INANOT (the Institute of NANO Testing).
Please see CIPS 2018 call for papers.
The deadline for the submission of abstracts is June15, 2017. Please kindly consider submitting your work to CIPS 2018.
Biological Metrology and Application (BA) Workshop was founded on February 1 2016.
ESREF 2016, the 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis will take place in Halle (Saale), Germany from September 19th to 22nd, 2016.
The conference continues to focus on recent developments and future directions in quality, robustness and reliability research of materials, components, integrated electronic circuits/systems and their nano-, micro-, power-, optoelectronics devices. ESREF provides the leading European forum for developing all aspects of reliability management and failure prevention for present and future electronics. ESREF 2016 will have a specific focus on reliability issues in automotive electronics.
For more details, please see ESREF_2016_CfP.pdf and visit ESREF 2016 web site.
NANOTS and INANOT web sevice will be unavailable from Septemer 19 to 21. We are sorry for the trouble we may cause you.
We have relocated our office to the following address:
Yoshihiro MIDOH and Katsuyoshi MIURA
Secretariat of the Institute of NANO testing
Nakamae Lab.
Dept. Information Systems Eng.
Grad. Sch. Informationn Science and Technology
Osaka University
1-5, Yamada-Oka, Suita, Osaka, 565-0871, JAPAN
Phone : 06-6879-7813 Fax : 06-6879-7812
E-mail : INANOT@ist.osaka-u.ac.jp
Web: http://www-INANOT.ist.osaka-u.ac.jp/
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